9646654

S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)
Configuration: Max R contrast
Surface quality, S-D: 20-20
Reflection p-pol: <1%
Protective chamfers: <0.25 mm x 45°
Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >60:1
Material: UVFS
Reflection s-pol, %: >85%
Wedge / Parallelism error: 1° (±5 arcmin)