In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
ROC S1, mm: +685.52
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +1500 (±3%)
Edge thickness, mm: 2 (±0.1)
Centration error: <3 arcmin
Dimensions, mm: Ø12.7 (+0/-0.1)
Clear Aperture: >90
Coatings: AR/AR (R<0.2%) @ 355 nm, AOI=0°
Wavelength, nm: 632.8
Material: UVFS
Surface quality, S-D: 40-20
ROC S1, mm: +685.52
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +1500 (±3%)
Edge thickness, mm: 2 (±0.1)
Centration error: <3 arcmin
Dimensions, mm: Ø12.7 (+0/-0.1)
Clear Aperture: >90
Coatings: AR/AR (R<0.2%) @ 355 nm, AOI=0°
Wavelength, nm: 632.8
Material: UVFS
