In stock
Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 750-850 (centered @ 800 nm)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Reflection p-pol: <1%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Extinction Ratio: >60:1
Dimensions, mm: 25 (+0/-0.1) x 75 (+0/-0.1) x 7 (±0.1)
Configuration: Max R contrast
Reflection s-pol, %: >85%
Clear Aperture: >90
Angle of Incidence (AOI), °: 72 (±2)
Wavelength, nm: 750-850 (centered @ 800 nm)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Reflection p-pol: <1%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Extinction Ratio: >60:1
Dimensions, mm: 25 (+0/-0.1) x 75 (+0/-0.1) x 7 (±0.1)
Configuration: Max R contrast
Reflection s-pol, %: >85%
Clear Aperture: >90
Angle of Incidence (AOI), °: 72 (±2)
