In stock
Reflectivity, %: R>99.5
Wavelength, nm: 355
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Parallelism error: <1 arcmin
Material: UVFS
Dimensions, mm: Ø38.1 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
S1 Surface quality, S-D: 20-10
Wavelength, nm: 355
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Parallelism error: <1 arcmin
Material: UVFS
Dimensions, mm: Ø38.1 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
S1 Surface quality, S-D: 20-10
