In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Wedge / Parallelism error: <1 arcmin
Transmission (s+p)/2 and wavelength, nm: T>95% @ 940
Surface quality, S-D: 20-10
Reflectivity (s+p)/2, %: R>99.5% @ 1030
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1) x 2 (±0.01)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Protective chamfers: 0.1-0.3 mm x 45°
Wedge / Parallelism error: <1 arcmin
Transmission (s+p)/2 and wavelength, nm: T>95% @ 940
Surface quality, S-D: 20-10
Reflectivity (s+p)/2, %: R>99.5% @ 1030
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1) x 2 (±0.01)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Protective chamfers: 0.1-0.3 mm x 45°
