In stock
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: -5.75
Center thickness, mm: 2 (±0.1)
Focal length, mm: -12.5 (±3%)
Centration error: <3 arcmin
Dimensions, mm: Ø8.0 (+0/-0.1)
Wavelength, nm: 632.8
S1/S2: AR (R<0.3%) @ 343-355 nm, AOI=0°
Clear Aperture: >90
LIDT: >4-5 J/cm2, 10 ns, 10 Hz, 355 nm
Protective chamfers: 0.1-0.3 mm x 45°
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: -5.75
Center thickness, mm: 2 (±0.1)
Focal length, mm: -12.5 (±3%)
Centration error: <3 arcmin
Dimensions, mm: Ø8.0 (+0/-0.1)
Wavelength, nm: 632.8
S1/S2: AR (R<0.3%) @ 343-355 nm, AOI=0°
Clear Aperture: >90
LIDT: >4-5 J/cm2, 10 ns, 10 Hz, 355 nm
