Out of stock
Protective chamfers: 0.1-0.3 mm x 45°
Surface quality, S-D: 20-10
Wavelength, nm: 1030-1064
Reflectivity, %: Rs>99.98, Rp>99.93
Material: UVFS
Angle of Incidence (AOI), °: 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 ( ±0.1)
Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90
Surface quality, S-D: 20-10
Wavelength, nm: 1030-1064
Reflectivity, %: Rs>99.98, Rp>99.93
Material: UVFS
Angle of Incidence (AOI), °: 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 ( ±0.1)
Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90
