In stock
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@ 532 nm, AOI=0 deg
S1: AR(R<0.2%)@ 532 nm, AOI=0 deg
ROC S1, mm: -22.85
Material: UVFS
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Clear Aperture: >90
Coatings:
Wavelength, nm: 632.8
Dimensions, mm: Ø12.7 (+0/-0.1)
Focal length, mm: -50 (±3%)
LIDT: >10 J/cm² @ 1064 nm; 10 ns; 10 Hz
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@ 532 nm, AOI=0 deg
S1: AR(R<0.2%)@ 532 nm, AOI=0 deg
ROC S1, mm: -22.85
Material: UVFS
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Clear Aperture: >90
Coatings:
Wavelength, nm: 632.8
Dimensions, mm: Ø12.7 (+0/-0.1)
Focal length, mm: -50 (±3%)
LIDT: >10 J/cm² @ 1064 nm; 10 ns; 10 Hz
