Out of stock
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
GDD, fs²: <70
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, Rsp %: 50 ±5
Rs-Rp, %: 5%
Surface quality, S-D: 20-20
Wavelength, nm: 515 - 532
Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
GDD, fs²: <70
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, Rsp %: 50 ±5
Rs-Rp, %: 5%
Surface quality, S-D: 20-20
Wavelength, nm: 515 - 532
Wedge / Parallelism error: <1 arcmin
