In stock
S1 Flatness, PV IR S2 Flatness, PV: λ/2 @ 633 nm
Protective chamfers: 0.1-0.2 mm x 45°
Surface quality S1/S2, S-D: 40-20
Wedge / Parallelism error: 0.2° ±0.1° (along 7 mm)
S2: ARp<0.3% @ 266 nm, AOI = 45°
S1(wedge, arrow marks): HRs>99.5% @ 532 nm + HTp>90% @ 266 nm, AOI = 45°
LIDT: >1 J/cm² at 1 ns, 266 nm, >5 J/cm² at 1 ns, 532 nm
Drawing: LP2077-2_rev00
Dimensions, mm: 7 x 6 (+0/-0.1)
Coatings:
Clear Aperture: >90
Chips: <0.1 mm
Thickness (at thin edge), mm: 1 (±0.1)
Material: CaF2 (DUV grade, free of laser induced fluorescence at 266 nm)
Protective chamfers: 0.1-0.2 mm x 45°
Surface quality S1/S2, S-D: 40-20
Wedge / Parallelism error: 0.2° ±0.1° (along 7 mm)
S2: ARp<0.3% @ 266 nm, AOI = 45°
S1(wedge, arrow marks): HRs>99.5% @ 532 nm + HTp>90% @ 266 nm, AOI = 45°
LIDT: >1 J/cm² at 1 ns, 266 nm, >5 J/cm² at 1 ns, 532 nm
Drawing: LP2077-2_rev00
Dimensions, mm: 7 x 6 (+0/-0.1)
Coatings:
Clear Aperture: >90
Chips: <0.1 mm
Thickness (at thin edge), mm: 1 (±0.1)
Material: CaF2 (DUV grade, free of laser induced fluorescence at 266 nm)
