In stock
Clear aperture: >90 %
Surface quality S1/S2, S-D: 40-20
Surface irregularity S1: <λ/4 @ 632.8 nm
Surface flatness S2: <λ/4 @ 632.8 nm
ROC S1, mm: ROC=-3.8 ±2%
Material: CaF2 (DUV grade, free of laser induced fluerescence at 266 nm)
Diameter, mm: 6 (+0/-0.05)
Chips: <0.2 mm
Protective chamfers: 0.1-0.3 mm x 45°
Centration error: <3 acrmin
Center thickness, mm: 2 (±0.2)
Edge thickness, mm: 3 (±0.2)
Surface quality S1/S2, S-D: 40-20
Surface irregularity S1: <λ/4 @ 632.8 nm
Surface flatness S2: <λ/4 @ 632.8 nm
ROC S1, mm: ROC=-3.8 ±2%
Material: CaF2 (DUV grade, free of laser induced fluerescence at 266 nm)
Diameter, mm: 6 (+0/-0.05)
Chips: <0.2 mm
Protective chamfers: 0.1-0.3 mm x 45°
Centration error: <3 acrmin
Center thickness, mm: 2 (±0.2)
Edge thickness, mm: 3 (±0.2)
