In stock
Material: CaF2 (DUV grade, free of laser induced fluerescence at 266 nm)
Surface quality S1/S2, S-D: 40-20
Surface irregularity S1: <λ/4@ 632.8 nm
Surface flatness S2: <λ/4 @ 632.8 nm
S2: AR(R<0.5%) @ 266 nm, AOI = 0°
ROC S1, mm: ROC=+19.1 ±0.5%
Drawing: LP1154-1_rev00
Centration error: <3 acrmin
Center thickness, mm: 3 (±0.1)
Coatings:
Clear Aperture: >90
Chips: <0.1 mm
Protective chamfers: 0.1-0.3 mm x 45°
Dimensions, mm: Ø15.0 (+0/-0.1)
S1: AR(R<0.5%) @ 266 nm, AOI = 0°
Surface quality S1/S2, S-D: 40-20
Surface irregularity S1: <λ/4@ 632.8 nm
Surface flatness S2: <λ/4 @ 632.8 nm
S2: AR(R<0.5%) @ 266 nm, AOI = 0°
ROC S1, mm: ROC=+19.1 ±0.5%
Drawing: LP1154-1_rev00
Centration error: <3 acrmin
Center thickness, mm: 3 (±0.1)
Coatings:
Clear Aperture: >90
Chips: <0.1 mm
Protective chamfers: 0.1-0.3 mm x 45°
Dimensions, mm: Ø15.0 (+0/-0.1)
S1: AR(R<0.5%) @ 266 nm, AOI = 0°
