In stock
Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 510-532+1020-1070
Reflectivity, %: Rs>99.3; Rp>98.5
Parallelism error: <1 arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Material: UVFS
Surface quality, S-D: 20-10
Wavelength, nm: 510-532+1020-1070
Reflectivity, %: Rs>99.3; Rp>98.5
Parallelism error: <1 arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Material: UVFS
Surface quality, S-D: 20-10
