In stock
AOI, °: 45
Clear Aperture: >90%
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
GDD, fs²: s-pol: ±10; p-pol: ±20
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity (average), %: >99.5
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
Wavelength, nm: 1000-1060
Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90%
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
GDD, fs²: s-pol: ±10; p-pol: ±20
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity (average), %: >99.5
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
Wavelength, nm: 1000-1060
Wedge / Parallelism error: <1 arcmin
