In stock
Reflectivity (average), %: >99.5
Clear Aperture: >90%
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 380-420
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
AOI, °: 0
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
GDD, fs²: s-pol: ±10; p-pol: ±20
Protective chamfers: <0.25 mm x 45°
Clear Aperture: >90%
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 380-420
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
AOI, °: 0
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
GDD, fs²: s-pol: ±10; p-pol: ±20
Protective chamfers: <0.25 mm x 45°
