In stock
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø50.8(+0/-0.1) x 6 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity (s+p)/2, %: R>99.4% @ 510-532
Surface quality, S-D: 20-10
Transmission (s+p)/2 and wavelength, nm: T>90% @ 1010-1070
Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90
Dimensions, mm: Ø50.8(+0/-0.1) x 6 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity (s+p)/2, %: R>99.4% @ 510-532
Surface quality, S-D: 20-10
Transmission (s+p)/2 and wavelength, nm: T>90% @ 1010-1070
Wedge / Parallelism error: <1 arcmin
