In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 633 nm
WFD, PV: <λ/4 @ 633 nm
Surface quality, S-D: 10-5
Substrate: Ti:Sa
Required documents: Certificate of Compliance
Parallelism error: <30 arcsec
Orientation: a-cut
IMPORTANT: Optical axis orientation must be ±2° in respect of symmetry axis(longer) of elliptical aperture
Figure of Merit (FOM): >150
Diameter, mm: Ø6 (+0/-0.1)
Clear aperture: >90%
Barel: Fine grounding
Angle to normal: Brewster cut
Absorption: >90% @ 532nm on the crystal length
Length, mm: 20 (±0.1)
WFD, PV: <λ/4 @ 633 nm
Surface quality, S-D: 10-5
Substrate: Ti:Sa
Required documents: Certificate of Compliance
Parallelism error: <30 arcsec
Orientation: a-cut
IMPORTANT: Optical axis orientation must be ±2° in respect of symmetry axis(longer) of elliptical aperture
Figure of Merit (FOM): >150
Diameter, mm: Ø6 (+0/-0.1)
Clear aperture: >90%
Barel: Fine grounding
Angle to normal: Brewster cut
Absorption: >90% @ 532nm on the crystal length
Length, mm: 20 (±0.1)
