In stock
Material: UVFS
Wavelength, nm: 266
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: >99.5
Protective chamfers: <0.25 mm x 45°
Parallelism error: <1 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 0
Wavelength, nm: 266
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: >99.5
Protective chamfers: <0.25 mm x 45°
Parallelism error: <1 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 0
