In stock
Material: UVFS
Wavelength, nm: 1030
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/5 @ 632.8 nm
Reflectivity, %: Rs>99.7; Rp>99.3
Parallelism error: <1 arcmin
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear aperture: >90
Angle of Incidence (AOI), °: 45
Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 1030
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/5 @ 632.8 nm
Reflectivity, %: Rs>99.7; Rp>99.3
Parallelism error: <1 arcmin
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear aperture: >90
Angle of Incidence (AOI), °: 45
Protective chamfers: <0.25 mm x 45°
