In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 1064
Surface quality, S-D: 20-10
Reflectivity, %: 95 (±1%)
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 0-5
Protective chamfers: <0.25 mm x 45°
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 1064
Surface quality, S-D: 20-10
Reflectivity, %: 95 (±1%)
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 0-5
Protective chamfers: <0.25 mm x 45°
