In stock
Protective chamfers: <0.25 mm x 45°
Angle of Incidence (AOI), °: 45
S1 Surface quality, S-D: 20-10
Wavelength, nm: 250-266
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: Rs>99.6; Rp>99.0
Parallelism error: <1 arcmin
Material: UVFS
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 45
S1 Surface quality, S-D: 20-10
Wavelength, nm: 250-266
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: Rs>99.6; Rp>99.0
Parallelism error: <1 arcmin
Material: UVFS
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)