In stock
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Reflectivity, %: Rs>99.5; Rp>98.5
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Wavelength, nm: 250-266
Parallelism error: <1 arcmin
S1 Surface quality, S-D: 20-10
Reflectivity, %: Rs>99.5; Rp>98.5
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Wavelength, nm: 250-266
Parallelism error: <1 arcmin
