In stock
Angle of Incidence (AOI), °: 45
Clear Aperture: 28 x 16
Dimensions tolerance, mm: +0.0/-0.2
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Pyramidal tolerance: <1 arcmin
Reflection Rs/ Rp/ Ravg, %: 99.5 / 98.5 / 99
S1 Surface quality, S-D:
Surface quality, S-D: 20-10
Wavelength, nm: 250-266
Clear Aperture: 28 x 16
Dimensions tolerance, mm: +0.0/-0.2
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Pyramidal tolerance: <1 arcmin
Reflection Rs/ Rp/ Ravg, %: 99.5 / 98.5 / 99
S1 Surface quality, S-D:
Surface quality, S-D: 20-10
Wavelength, nm: 250-266
