Out of stock
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
GDD, fs²: <150
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, Rsp %: 50 ±2
S1 Flatness, PV: <λ/4 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 3
Wavelength, nm: 532
Wedge / Parallelism error: < 10 arcsec
Clear aperture: >90
Dimensions, mm: 25.4
GDD, fs²: <150
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, Rsp %: 50 ±2
S1 Flatness, PV: <λ/4 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 3
Wavelength, nm: 532
Wedge / Parallelism error: < 10 arcsec