In stock
Angle of Incidence (AOI), °: 45
Clear aperture: 80
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.6
S1 Flatness, PV: <λ/10 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 5
Wavelength, nm: 515
Wedge / Parallelism error: <1 arcmin
Clear aperture: 80
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.6
S1 Flatness, PV: <λ/10 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 5
Wavelength, nm: 515
Wedge / Parallelism error: <1 arcmin