In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/10-λ/8 @ 632.8nm
Wedge / Parallelism error: <1° ±5 arcmin
Surface quality, S-D: 20-10
Protective chamfers: 0.2-0.3 mm x 45°
Material: UVFS
Dimensions, mm: 50.8 (+0/-0.1) x 6 at thinnest point ( ±0.1)
Clear Aperture: >90
Wedge / Parallelism error: <1° ±5 arcmin
Surface quality, S-D: 20-10
Protective chamfers: 0.2-0.3 mm x 45°
Material: UVFS
Dimensions, mm: 50.8 (+0/-0.1) x 6 at thinnest point ( ±0.1)
Clear Aperture: >90
