In stock
Angle of Incidence (AOI), °: 45
Chips: <0.1 mm
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 80 x 10
Material: UVFS
Protective chamfers: 0.2-0.3 mm x 45°
Reflectivity, %: >99.5/>99.0
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 10
Wavelength, nm: 1010-1050
Wedge / Parallelism error: 1.5 arcmin
Chips: <0.1 mm
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 80 x 10
Material: UVFS
Protective chamfers: 0.2-0.3 mm x 45°
Reflectivity, %: >99.5/>99.0
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 10
Wavelength, nm: 1010-1050
Wedge / Parallelism error: 1.5 arcmin
