In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Centration error: <3 arcmin
Surface quality, S-D: 40-20
ROC S1, mm: +685.52
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø12.7 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Focal length, mm: +1500 (±3%)
Centration error: <3 arcmin
Surface quality, S-D: 40-20
ROC S1, mm: +685.52
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø12.7 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Focal length, mm: +1500 (±3%)
