In stock
Material: UVFS
Wavelength, nm: 632.8
ROC S1, mm: +16
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +35 (±3%)
Wavelength, nm: 632.8
ROC S1, mm: +16
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +35 (±3%)
