In stock
Angle of Incidence (AOI), °: 0-8
Clear aperture: >90
Comments: +HT@532nm
Dimensions, mm: 25.4
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: -750
Reflectivity (s+p)/2, %: >99.5
Surface quality, S-D: 40-20
Thickness, mm: 6
Wavelength, nm: 750-850
Clear aperture: >90
Comments: +HT@532nm
Dimensions, mm: 25.4
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: -750
Reflectivity (s+p)/2, %: >99.5
Surface quality, S-D: 40-20
Thickness, mm: 6
Wavelength, nm: 750-850
