In stock
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions, mm: 20 x 50
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
Reflectivity, %: <2.5
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Surface quality, S-D: 20-10
Thickness, mm: 0.5
Wavelength, nm: 450-1200
Wedge / Parallelism error: 10° ±5 arcmin
Clear aperture: >90
Dimensions, mm: 20 x 50
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
Reflectivity, %: <2.5
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Surface quality, S-D: 20-10
Thickness, mm: 0.5
Wavelength, nm: 450-1200
Wedge / Parallelism error: 10° ±5 arcmin
