In stock
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 20x40
GDD, fs²: s-pol: ±10; p-pol: ±20
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: λ/8 @ 633 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 7
Wavelength, nm: 1000-1060
Wedge / Parallelism error: <1 arcmin
Clear aperture: >90
Dimensions, mm: 20x40
GDD, fs²: s-pol: ±10; p-pol: ±20
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: λ/8 @ 633 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 7
Wavelength, nm: 1000-1060
Wedge / Parallelism error: <1 arcmin
