In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
ROC S1, mm: -228.51
Protective chamfers: <0.25 mm x 45°
Focal length, mm: -500 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Material: UVFS
Surface quality, S-D: 40-20
ROC S1, mm: -228.51
Protective chamfers: <0.25 mm x 45°
Focal length, mm: -500 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Material: UVFS
