In stock
Angle of Incidence (AOI), °: 0
Clear Aperture: >90
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
Surface quality, S-D: 20-10
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
Surface quality, S-D: 20-10
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
