In stock
Parallelism error: <1 arcmin
Material: CaF2 (DUV grade)
Thickness, mm: 1 (±0.1)
Surface quality S1/S2, S-D: 20-10
Diameter, mm: 6 (+0/-0.1)
Protective chamfers: 0.1-0.2 mm x 45°
Clear Aperture: >85
Chips: <0.1 mm
S1 Flatness, PV IR S2 Flatness, PV: λ/2@ 633 nm
Material: CaF2 (DUV grade)
Thickness, mm: 1 (±0.1)
Surface quality S1/S2, S-D: 20-10
Diameter, mm: 6 (+0/-0.1)
Protective chamfers: 0.1-0.2 mm x 45°
Clear Aperture: >85
Chips: <0.1 mm
S1 Flatness, PV IR S2 Flatness, PV: λ/2@ 633 nm
