9001190

Tavg: >85% for wavelength band of 450 - 1150 nm
Wedge / Parallelism error: < 2 micron
Surface Quality: 60-40 S-D
S1 Flatness, PV IR S2 Flatness, PV: λ/6 @ 632.8 nm (both S1 and S2)
S2: >22.5
S1: >20.5
ROC2, mm: 17.51 (±0.01) CX
ROC S1, mm: 28.24 (±0.02) CC
Center thickness, mm: 7.0 (±0.03)
Material: N-SF19
Edge thickness, mm: (3.6)
Dimensions A x B x C, mm: Ø26 (+0/-0.02)
Clear Aperture:
Chamfer: 0.3 x 45°